Midterm exam

English translation

Week 8

Exam scope and review topics

• Read device records with arrays and plots — time, measurements, units, and missing values
• GPIO inputs and edges — polling intervals and missed transitions
• Contact bounce and input decisions — minimum intervals and accepted edge records
• I²C data and signed integers — high/low bytes and 2's complement
• Sensor scale and deviation — convert raw values to physical units
• Store and query measurement records — device and time keys, and duplicate measurement handling